19 citations · 21 across the 4 of their papers we have counts for
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cond-mat.mtrl-sci2014
Reproducible x-ray reflectometry optimization: statistical analysis of differential evolution fitting of multilayer structural models
Donald Windover, David Gil, Yasushi Azuma +1
We test the reproducibility of X-ray reflectometry(XRR) measurements and optimizations using an National Metrology Institute of Japan (NMIJ)/National Institute of Advanced Industri…
cond-mat.mtrl-sci2013★ 2 cited
Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials
Donald Windover, David L. Gil, Yasushi Azuma +1
X-ray reflectometry (XRR) provides researchers and manufacturers with a non-destructive way to determine thickness, roughness, and density of thin films deposited on smooth substra…