most citedUsing coherent X-rays to directly measure the propagation velocity of defects during thin film deposition

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cond-mat.mtrl-sci2015★ 1 cited

Using coherent X-rays to directly measure the propagation velocity of defects during thin film deposition

Jeffrey G. Ulbrandt, Meliha G. Rainville, Christa Hoskin +5

The properties of artificially grown thin films are often strongly affected by the dynamic relationship between surface growth processes and subsurface structure. Coherent mixing o…