collaborators

1 paper

cond-mat.mtrl-sci2015

Growth, characterization, and transport properties of ternary (Bi1-xSbx)2Te3 topological insulator layers

C. Weyrich, M. Drögeler, J. Kampmeier +12

Ternary (Bi1-xSbx)2Te3 films with an Sb content between 0 and 100% were deposited on a Si(111) substrate by means of molecular beam epitaxy. X-ray diffraction measurements confirm…