most citedExact location of dopants below the Si(001):H surface from scanning tunnelling microscopy and density functional theory

14 citations · 14 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2015★ 14 cited

Exact location of dopants below the Si(001):H surface from scanning tunnelling microscopy and density functional theory

Veronika Brazdova, David R. Bowler, Kitiphat Sinthiptharakoon +5

Control of dopants in silicon remains the most important approach to tailoring the properties of electronic materials for integrated circuits, with Group V impurities the most impo…