most citedThe charge transport mechanism and electron trap nature in thermal oxide on silicon

22 citations · 22 across the 1 of their papers we have counts for

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1 paper

cond-mat.mes-hall2016★ 22 cited

The charge transport mechanism and electron trap nature in thermal oxide on silicon

Damir R. Islamov, Vladimir A. Gritsenko, Timofey V. Perevalov +2

The charge transport mechanism of electron via traps in amorphous SiO has been studied. Electron transport is limited by phonon-assisted tunneling between traps. Thermal and op…