73 citations · 92 across the 2 of their papers we have counts for
3 papers
Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy
Hiroaki Ooe, Dominik Kirpal, Daniel S. Wastl +3
In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexu…
Optimizing atomic resolution of force microscopy in ambient conditions
Daniel S. Wastl, Alfred J. Weymouth, Franz J. Giessibl
Ambient operation poses a challenge to AFM because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to…
qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution
M. Schneiderbauer, F. J. Giessibl
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. T…