most citedFabrication of sharp atomic force microscope probes using in-situ local electric field induced deposition under ambient conditions

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cond-mat.mes-hall2016★ 3 cited

Fabrication of sharp atomic force microscope probes using in-situ local electric field induced deposition under ambient conditions

Alexei Temiryazev, Sergey I. Bozhko, A. Edward Robinson +1

We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based o…