19 citations · 25 across the 2 of their papers we have counts for
2 papers
cs.IT2016★ 6 cited
Using Dynamic Allocation of Write Voltage to Extend Flash Memory Lifetime
Haobo Wang, Nathan Wong, Tsung-Yi Chen +1
The read channel of a Flash memory cell degrades after repetitive program and erase (P/E) operations. This degradation is often modeled as a function of the number of P/E cycles. I…
cs.IT2014★ 19 cited
Histogram-Based Flash Channel Estimation
Haobo Wang, Tsung-Yi Chen, Richard D. Wesel
Current generation Flash devices experience significant read-channel degradation from damage to the oxide layer during program and erase operations. Information about the read-chan…