2 papers
physics.ins-det2016
High-Throughput Atomic Force Microscopes Operating in Parallel
H. Sadeghian, R. Herfst, B. Dekker +3
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for stat…
physics.ins-det2016
Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy
Tom Bijnagte, Geerten Kramer, Lukas Kramer +3
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manual…