most citedStrain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

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cond-mat.str-el2015★ 16 cited

Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi

T. Lancaster, F. Xiao, Z. Salman +9

We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40 nm-thick film of MnSi on Si(111) in the region of the field-temperature phase…