2 papers
cond-mat.mtrl-sci2016
Quantitative strain analysis of InAs/GaAs quantum dot materials
Per Erik Vullum, Magnus Nord, Maryam Vatanparast +5
Geometric phase analysis has been applied to high resolution aberration corrected (scanning) transmission electron microscopy images of InAs/GaAs quantum dot (QD) materials. We sho…
cond-mat.mtrl-sci2016
Bandgap measurement of high refractive index materials by off-axis EELS
Maryam Vatanparast, Ricardo Egoavil, Turid W. Reenaas +3
In the present work, Cs aberration corrected and monochromated scanning transmission electron microscopy electron energy loss spectroscopy STEM-EELS has been used to explore experi…