45 citations · 108 across the 4 of their papers we have counts for
4 papers
Four-point probe measurements using current probes with voltage feedback to measure electric potentials
F. Lüpke, D. Cuma, S. Korte +2
We present a four-point probe resistance measurement technique which uses four equivalent current measuring units, resulting in minimal hardware requirements and corresponding sour…
Surface Conductivity of Si(100) and Ge(100) Surfaces Determined from Four-Point Transport Measurements Using an Analytical N-Layer Conductance Model
Sven Just, Helmut Soltner, Stefan Korte +2
An analytical N-layer model for charge transport close to a surface is derived from the solution of Poisson's equation and used to describe distance-dependent electrical four-point…
Scanning tunneling potentiometry implemented into a multi-tip setup by software
F. Lüpke, S. Korte, V. Cherepanov +1
We present a multi-tip scanning tunneling potentiometry technique that can be implemented into existing multi-tip scanning tunneling microscopes without hardware changes. The resul…
Surface and Step Conductivities on Si(111) Surfaces
Sven Just, Marcus Blab, Stefan Korte +3
Four-point measurements using a multi-tip scanning tunneling microscope (STM) are carried out in order to determine surface and step conductivities on Si(111) surfaces. In a first…