2 papers
physics.app-ph2017
On modeling and measuring viscoelasticity with dynamic Atomic Force Microscopy
Per-Anders Thorén, Riccardo Borgani, Daniel Forchheimer +7
The interaction between a rapidly oscillating atomic force microscope tip and a soft material surface is described using both elastic and viscous forces with a moving surface model…
cond-mat.mes-hall2017
Background force compensation in dynamic atomic force microscopy
Riccardo Borgani, Per-Anders Thorén, Daniel Forchheimer +4
Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of…