Measurement of low-energy background events due to ${}^{222}$Rn contamination on the surface of a NaI(Tl) crystal

K. W. Kim, C. Ha, N. Y. Kim +4

It has been known that decays of daughter elements of ${}^{222}$Rn on the surface of a detector cause significant background at energies below 10 keV. In particular ${}^{210}$Pb and $^…