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math.AP2016
Unique determination of the index of refraction from phase-less near-field data in two dimensions
Yat Tin Chow, Fadil Santosa, Gunther Uhlmann
Motivated by non-destructive testing of optical fiber, we consider the problem of determining the index of refraction of a two-dimensional medium from magnitude of the total field…
math.AP2014
A variational approach to the inverse photolithography problem
Luca Rondi, Fadil Santosa, Zhu Wang
Photolithography is a process in the production of integrated circuits in which a mask is used to create an exposed pattern with a desired geometric shape. In the inverse problem o…
math.AP2010★ 1 cited
Analysis of an Inverse Problem Arising in Photolithography
Luca Rondi, Fadil Santosa
We consider the inverse problem of determining an optical mask that produces a desired circuit pattern in photolithography. We set the problem as a shape design problem in which th…