2 papers
physics.optics2026
The 2D approximation quickly breaks down in reflection ptychography
Sander Senhorst, Stefan Witte, Wim Coene
Ptychographic reconstructions in reflection geometries are commonly interpreted with the same two-dimensional thin-sample model used in transmission, yet the validity of this appro…
physics.app-ph2024
Lossless photon flux sensing methodology for EUV and Soft X-ray metrology systems
Sven Weerdenburg, Roland Horsten, Wim Coene
We demonstrate a simple, lossless method for monitoring photon flux in short-wavelength metrology systems, with a particular focus on applications using high harmonic generation (H…