Shotaro Oie

most citedData-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si

_{4}

_{5}

_{3}

/ 6H-SiC (0001)-(

3 \times 3

) R30

^{\circ}

7 citations · 7 across the 1 of their papers we have counts for

collaborators

1 paper

cond-mat.mtrl-sci2021★ 7 cited

Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si $_{4}$ O $_{5}$ N $_{3}$ / 6H-SiC (0001)-( $3 \times 3$ ) R30 $^{\circ}$

Takeo Hoshi, Daishiro Sakata, Shotaro Oie +4

The present article proposes a data analysis method for experimentally-derived measurements, which consists of an auto-optimization procedure and a sensitivity analysis. The method…

Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si4​O5​N3​ / 6H-SiC (0001)-(3​×3​) R30∘

Data-driven sensitivity analysis in a total-reflection high-energy positron diffraction (TRHEPD) experiment of the Si $_{4}$ O $_{5}$ N $_{3}$ / 6H-SiC (0001)-( $3 \times 3$ ) R30 $^{\circ}$