most citedAccelerated Lifetime Testing and Analysis of Delta-doped Silicon Test Structures

6 citations · 6 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2021★ 6 cited

Accelerated Lifetime Testing and Analysis of Delta-doped Silicon Test Structures

Connor Halsey, Jessica Depoy, DeAnna M. Campbell +7

As transistor features shrink beyond the 2 nm node, studying and designing for atomic scale effects become essential. Being able to combine conventional CMOS with new atomic scale…