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S. Rinaudo

1 paper hereh-index 9416 citations66 works total

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author position
  • middle author1

Across the 1 of 1 paper where every author was matched, so the position is known.

fields
  • cs.AR1

identity via Semantic Scholar / OpenAlex

collaborators

1 paper

cs.AR2021

Comparing different solutions for testing resistive defects in low-power SRAMs

Nunzio Mirabella, Michelangelo Grosso, Giovanna Franchino +4

Low-power SRAM architectures are especially sensitive to many types of defects that may occur during manufacturing. Among these, resistive defects can appear. This paper analyzes s…

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