20 citations · 38 across the 3 of their papers we have counts for
3 papers
cond-mat.mes-hall2022★ 5 cited
Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images
A. Leis, V. Cherepanov, B. Voigtländer +1
Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a samp…
cond-mat.mtrl-sci2017★ 13 cited
Si(111) strained layers on Ge(111): evidence for c(2x4) domains
R. Zhachuk, J. Coutinho, A. Dolbak +2
The tensile strained Si(111) layers grown on top of Ge(111) substrates are studied by combining scanning tunneling microscopy, low energy electron diffraction and first-principles…
cond-mat.mes-hall2016★ 20 cited
Surface Conductivity of Si(100) and Ge(100) Surfaces Determined from Four-Point Transport Measurements Using an Analytical N-Layer Conductance Model
Sven Just, Helmut Soltner, Stefan Korte +2
An analytical N-layer model for charge transport close to a surface is derived from the solution of Poisson's equation and used to describe distance-dependent electrical four-point…