410 citations · 1.3k across the 36 of their papers we have counts for
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Impact of Interlayer and Ferroelectric Materials on Charge Trapping during Endurance Fatigue of FeFET with TiN/HfxZr1-xO2/interlayer/Si (MFIS) Gate Structure
Fengbin Tian, Shujing Zhao, Hao Xu +9
We study the impact of different interlayers and ferroelectric materials on charge trapping during the endurance fatigue of Si FeFET with TiN/HfxZr1-xO2/interlayer/Si (MFIS) gate s…
Experimental Extraction and Simulation of Charge Trapping during Endurance of FeFET with TiN/HfZrO/SiO2/Si (MFIS) Gate Structure
Shujing Zhao, Fengbin Tian, Hao Xu +8
We investigate the charge trapping during endurance fatigue of FeFET with TiN/Hf0.5Zr0.5O2/SiO2/Si (MFIS) gate structure. We propose a method of experimentally extracting the numbe…
Enhancement of microwave squeezing via parametric down-conversion in a superconducting quantum circuit
Kong Han, Yimin Wang, Guo-Qiang Zhang
We propose an experimentally accessible superconducting quantum circuit, consisting of two coplanar waveguide resonators (CWRs), to enhance the microwave squeezing via parametric d…
Vision Transformer Pruning
Mingjian Zhu, Yehui Tang, Kai Han
Vision transformer has achieved competitive performance on a variety of computer vision applications. However, their storage, run-time memory, and computational demands are hinderi…