most citedSTEM image analysis based on deep learning: identification of vacancy defects and polymorphs of

47 citations · 47 across the 1 of their papers we have counts for

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1 paper

cond-mat.mes-hall2022★ 47 cited

STEM image analysis based on deep learning: identification of vacancy defects and polymorphs of

Kihyun Lee, Jinsub Park, Soyeon Choi +9

Scanning transmission electron microscopy (STEM) is an indispensable tool for atomic-resolution structural analysis for a wide range of materials. The conventional analysis of STEM…