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cond-mat.mtrl-sci2022
Variable-wavelength quick scanning nano-focused X-ray microscopy for in situ strain and tilt mapping
Marie-ingrid Richard, Thomas W Cornelius, Florian Lauraux +7
Compression of micro-pillars is followed in situ by a quick nano-focused X-ray scanning microscopy technique combined with three-dimensional reciprocal space mapping. Compared to o…
cond-mat.mtrl-sci2013★ 4 cited
Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals
G. Beutier, M. Verdier, M. De Boissieu +6
Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements…