41 citations · 81 across the 4 of their papers we have counts for
4 papers
Study and characterization of GaN MOS capacitors: planar versus trench topographies
K. Mukherjee, C. De Santi, S. You +9
Developing high quality GaN/dielectric interfaces is a fundamental step for manufacturing GaN vertical power transistors. In this paper, we quantitatively investigate the effect of…
Positive and negative charge trapping GaN HEMTs: interplay between thermal emission and transport-limited processes
A. Nardo, C. De Santi, C. Koller +5
This paper investigates the kinetics of buffer trapping in GaN-based normally-off high-voltage transistors. The analysis was carried out on transfer-length method (TLM) structures.…
The effect of the three-dimensional strain variation on the emission properties of light-emitting diodes based on (In,Ga)N/GaN nanowires
M. Musolino, F. Sacconi, A. Tahraoui +5
In the experimental electroluminescence (EL) spectra of light-emitting diodes (LEDs) based on N-polar (In,Ga)N/GaN nanowires (NWs), we observed a double peak structure. The relativ…
A physical model for the reverse leakage current in (In,Ga)N/GaN light-emitting diodes based on nanowires
M. Musolino, D. van Treeck, A. Tahraoui +6
We investigated the origin of the high reverse leakage current in light emitting diodes (LEDs) based on (In,Ga)N/GaN nanowire (NW) ensembles grown by molecular beam epitaxy on Si s…