2 citations · 2 across the 4 of their papers we have counts for
4 papers
Beware of Discarding Used SRAMs: Information is Stored Permanently
Joshua Hovanes, Yadi Zhong, Ujjwal Guin
Data recovery has long been a focus of the electronics industry for decades by security experts, focusing on hard disk recovery, a type of non-volatile memory. Unfortunately, none…
Complexity Analysis of the SAT Attack on Logic Locking
Yadi Zhong, Ujjwal Guin
Due to the adoption of horizontal business models following the globalization of semiconductor manufacturing, the overproduction of integrated circuits (ICs) and the piracy of inte…
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking
Yadi Zhong, Ayush Jain, M. Tanjidur Rahman +3
The outsourcing of the design and manufacturing of integrated circuits has raised severe concerns about the piracy of Intellectual Properties and illegal overproduction. Logic lock…
A Comprehensive Test Pattern Generation Approach Exploiting SAT Attack for Logic Locking
Yadi Zhong, Ujjwal Guin
The need for reducing manufacturing defect escape in today's safety-critical applications requires increased fault coverage. However, generating a test set using commercial automat…