Thickness dependence of surface diffusion in epitaxial LaAlO3 on SrTiO3(001)

J. D. Ferguson, Y. Kim, A. R. Woll +1

The LaAlO3/SrTiO3 (001) thin film materials system was studied using in situ, simultaneous x-ray diffuse scattering and specular reflectivity during pulsed laser deposition. Using…