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researcher

D. Abraham

4 papers hereh-index 7014.6k citations299 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author4

Across the 4 of 4 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci3
  • physics.chem-ph1
same name
  • D. Abraham — 15 papers, h 22
  • D. Abraham — 10 papers, h 37
  • D. Abraham — 9 papers, h 5
  • D. Abraham — 3 papers, h 1
  • D. Abraham — 1 paper, h 19
  • D. Abraham — 1 paper, h 2

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20122022
most citedReal-Time Stress Measurements in Lithium-ion Battery Negative-electrodes

219 citations · 427 across the 4 of their papers we have counts for

collaborators
Showing cond-mat.mtrl-sciShow all

3 papers · 1 filter

cond-mat.mtrl-sci2015★ 106 cited

Stress Evolution in Lithium-ion Composite Electrodes during Electrochemical Cycling and Resulting Internal Pressures on the Cell Casing

Siva P. V. Nadimpalli, Vijay A. Sethuraman, Daniel P. Abraham +2

Composite cathode coatings made of a high energy density layered oxide (Li1.2Ni0.15Mn0.55Co0.1O2, theoretical capacity ~377 mAh/g), polyvinylidene fluoride (PVdF) binder, and elect…

cond-mat.mtrl-sci2013★ 79 cited

Stress Evolution in Composite Silicon Electrodes during Lithiation/Delithiation

Vijay A. Sethuraman, Annam Nguyen, Michael J. Chon +6

We report real-time average stress measurements on composite silicon electrodes made with two different binders [Carboxymethyl cellulose (CMC), and polyvinylidene fluoride (PVDF)]…

cond-mat.mtrl-sci2012★ 219 cited

Real-Time Stress Measurements in Lithium-ion Battery Negative-electrodes

Vijay A. Sethuraman, Nathan Van Winkle, Daniel P. Abraham +2

Real-time stress evolution in a graphite-based lithium-ion battery negative-electrode during electrolyte wetting and electrochemical cycling is measured through wafer-curvature met…

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