most citedA simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS on SiO

9 citations · 9 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2022★ 9 cited

A simple KPFM-based approach for electrostatic-free topographic measurements: the case of MoS on SiO

Aloïs Arrighi, Nathan Ullberg, Vincent Derycke +1

A simple implementation of Kelvin probe force microscopy is reported that enables recording topographic images in the absence of any component of the electrostatic force. Our appro…