most citedThickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry

38 citations · 38 across the 1 of their papers we have counts for

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physics.optics2022★ 38 cited

Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry

Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran +4

As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in t…