38 citations · 56 across the 2 of their papers we have counts for
2 papers
physics.optics2022★ 38 cited
Thickness mapping and layer number identification of exfoliated van der Waals materials by Fourier imaging micro-ellipsometry
Ralfy Kenaz, Saptarshi Ghosh, Pradheesh Ramachandran +4
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in t…
physics.optics2022★ 18 cited
Mapping single-shot angle-resolved spectroscopic micro-ellipsometry with sub-5 microns lateral resolution
Ralfy Kenaz, Ronen Rapaport
Spectroscopic ellipsometry is a widely used optical technique both in industry and research for determining the optical properties and thickness of thin films. The effective use of…