31 citations · 36 across the 4 of their papers we have counts for
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Shai Levy, Issai Shlimak, Avraham Chelly +2
Metal-Oxide-Semiconductor (MOS) structures containing 74Ge nanocrystals (NC-Ge) imbedded inside the SiO_2 layer were studied for their capacitance characterization. Ge atoms were i…