4 citations · 5 across the 2 of their papers we have counts for
2 papers
cs.ET2023★ 1 cited
Experimental analysis of variability in WS-based devices for hardware security
M. Vatalaro, H. Neill, F. Gity +8
This work investigates the variability of tungsten disulfide (WS)-based devices by experimental characterization in view of possible application in the field of hardware securi…
cond-mat.mes-hall2010★ 4 cited
Criticisms on and Comparison of Experimental Channel Backscattering Extraction Methods
Gino Giusi, Felice Crupi, Paolo Magnone
In this paper we critically review and compare experimental methods, based on the Lundstrom model, to extract the channel backscattering ratio in nano MOSFETs. Basically two experi…