31 citations · 31 across the 2 of their papers we have counts for
2 papers
cond-mat.mes-hall2011★ 31 cited
Atomistic approach to alloy scattering in
Saumitra R Mehrotra, Abhijeet Paul, Gerhard Klimeck
SiGe alloy scattering is of significant importance with the introduction of strained layers and SiGe channels into CMOS technology. However, alloy scattering has till now been trea…
cond-mat.mes-hall2010
Interface Trap Density Metrology of state-of-the-art undoped Si n-FinFETs
Giuseppe Carlo Tettamanzi, Abhijeet Paul, Sunhee Lee +5
The presence of interface states at the MOS interface is a well-known cause of device degradation. This is particularly true for ultra-scaled FinFET geometries where the presence o…