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20112023
most citedOptimizing atomic resolution of force microscopy in ambient conditions

73 citations · 253 across the 8 of their papers we have counts for

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cond-mat.mes-hall2016★ 19 cited

Amplitude dependence of image quality in atomically-resolved bimodal atomic microscopy

Hiroaki Ooe, Dominik Kirpal, Daniel S. Wastl +3

In bimodal FM-AFM, two flexural modes are excited simultaneously. The total vertical oscillation deflection range of the tip is the sum of the peak-to-peak amplitudes of both flexu…