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cond-mat.mtrl-sci2025★ 1 cited
Resistivity measurement for non-magnetic materials using high-order resonance mode of mfm-cantilever oscillation
Kazuma Okamoto, Takumi Imura, Satoshi Abo +3
A method to measure the electrical resistivity of materials using magnetic-force microscopy (MFM) is discussed, where MFM detects the magnetic field caused by the tip-oscillation-i…
cond-mat.mtrl-sci2011
Field emission from atomically thin edges of reduced graphene oxide
Hisato Yamaguchi, Katsuhisa Murakami, Goki Eda +13
Point sources exhibit low threshold electron emission due to local field enhancement at the tip. The development and implementation of tip emitters have been hampered by the need t…