most citedPolarimetric iToF: Measuring High-Fidelity Depth through Scattering Media

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cs.CV2023★ 1 cited

Polarimetric iToF: Measuring High-Fidelity Depth through Scattering Media

Daniel S. Jeon, Andreas Meuleman, Seung-Hwan Baek +1

Indirect time-of-flight (iToF) imaging allows us to capture dense depth information at a low cost. However, iToF imaging often suffers from multipath interference (MPI) artifacts i…