196 citations · 2.4k across the 65 of their papers we have counts for
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physics.ins-det2011★ 31 cited
Study of X-ray Radiation Damage in Silicon Sensors
Jiaguo Zhang, Eckhart Fretwurst, Robert Klanner +4
The European X-ray Free Electron Laser (XFEL) will deliver 30,000 fully coherent, high brilliance X-ray pulses per second each with a duration below 100 fs. This will allow the rec…
physics.ins-det2011★ 6 cited
Study of radiation damage induced by 12 keV X-rays in MOS structures built on high resistivity n-type silicon
Jiaguo Zhang, Ioana Pintilie, Eckhart Fretwurst +3
Imaging experiments at the European X-ray Free Electron Laser (XFEL) require silicon pixel sensors with extraordinary performance specifications: Doses of up to 1 GGy of 12 keV pho…