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20112026
most citedTwo-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping

1.2k citations · 7k across the 74 of their papers we have counts for

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Showing 2018Show all

10 papers · 1 filter

cond-mat.mes-hall2018

Scanning transmission electron microscopy under controlled low-pressure atmospheres

Gregor T. Leuthner, Stefan Hummel, Clemens Mangler +4

Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column.…

cond-mat.mtrl-sci2018★ 26 cited

Influence of temperature on the displacement threshold energy in graphene

Alexandru I. Chirita Mihaila, Toma Susi, Jani Kotakoski

The atomic structure of nanomaterials is often studied using transmission electron microscopy. In addition to image formation, the energetic electrons may also cause damage while i…

physics.app-ph2018★ 16 cited

Direct visualization of the 3D structure of silicon impurities in graphene

Christoph Hofer, Viera Skakalova, Mohammad Reza Ahmadpour Monazam +4

We directly visualize the three-dimensional (3D) geometry and dynamics of silicon impurities in graphene as well as their dynamics by aberration-corrected scanning transmission ele…

cond-mat.mtrl-sci2018★ 22 cited

Intrinsic core level photoemission of suspended graphene

Toma Susi, Mattia Scardamaglia, Kimmo Mustonen +11

X-ray photoelectron spectroscopy of graphene is important both for its characterization and as a model for other carbon materials. Despite great recent interest, the intrinsic phot…

physics.app-ph2018

Revealing the 3D Structure of Graphene Defects

Christoph Hofer, Christian Kramberger, Mohammad Reza Ahmadpour Monazam +5

We demonstrate insights into the three-dimensional structure of defects in graphene, in particular grain boundaries, obtained via a new approach from two transmission electron micr…

physics.app-ph2018★ 121 cited

Nanopore fabrication and characterization by helium ion microscopy

D. Emmrich, A. Beyer, A. Nadzeyka +4

The Helium Ion Microscope (HIM) has the capability to image small features with a resolution down to 0.35 nm due to its highly focused gas field ionization source and its small bea…