Experimental determination of tunneling characteristics and dwell times from temperature dependence of Al/Al${}_2$O${}_3$/Al junctions

Edgar J. Patiño, N. G. Kelkar

Measurements of current-voltage (I-V) characteristics of a high quality Al/Al${}_2$O${}_3$/Al junction at temperatures ranging from 3.5 K to 300 K have been used to extract the barrier…