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D. Bodean

2 papers hereh-index 27 citations4 works total

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author position
  • first author1
  • middle author1

Across the 2 of 2 papers where every author was matched, so the position is known.

fields
  • cs.AR2

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collaborators
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2 papers · 1 filter

cs.AR2011

Pseudo-Ring Testing Schemes and Algorithms of RAM Built-In and Embedded Self-Testing

Diana Bodean, Ghenadie Bodean, Wajeb Gharibi

Scan and ring schemes of the pseudo-ring memory selftesting are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itsel…

cs.AR2007

New Schemes for Self-Testing RAM

Gh. Bodean, D. Bodean, A. Labunetz

This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented an…

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