3 papers
physics.app-ph2026
Sensitivity Improvement by Sample Vibration Excitation in Resistivity Measurement for Non-Magnetic Material Using MFM
Kazuma Okamoto, Takumi Imura, Naruto Nakamura +4
A novel approach for measuring the electrical resistivity of non-magnetic materials using magnetic force microscopy (MFM) is discussed. In this method, MFM detects magnetic fields…
physics.app-ph2025
Monochromatic Electron Emission from Graphene-Insulator-Semiconductor-Structured Electron Source Utilizing Interference Efficets
Takao Koichi, Shogo Kawashima, Hiroshi Miyake +4
The graphene-insulator-semiconductor-structured electron source has garnered significant attention due to its high electron emission efficiency and highly monochromatic electron em…
cond-mat.mtrl-sci2025
Resistivity measurement for non-magnetic materials using high-order resonance mode of mfm-cantilever oscillation
Kazuma Okamoto, Takumi Imura, Satoshi Abo +3
A method to measure the electrical resistivity of materials using magnetic-force microscopy (MFM) is discussed, where MFM detects the magnetic field caused by the tip-oscillation-i…