SpeckleNN: A unified embedding for real-time speckle pattern classification in X-ray single-particle imaging with limited labeled examples

Cong Wang, Eric Florin, Hsing-Yin Chang +2

With X-ray free-electron lasers (XFELs), it is possible to determine the three-dimensional structure of noncrystalline nanoscale particles using X-ray single-particle imaging (SPI)…