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In Situ Measurements of Stress Evolution in Silicon Thin Films During Electrochemical Lithiation and Delithiation
Vijay A. Sethuraman, Michael J. Chon, Maxwell Shimshak +2
We report in situ measurements of stress evolution in a silicon thin-film electrode during electrochemical lithiation and delithiation by using the Multi-beam Optical Sensor (MOS)…
In situ Measurement of Biaxial Modulus of Si Anode for Li-ion Batteries
Vijay A. Sethuraman, Michael J. Chon, Maxwell Shimshak +2
We report in situ measurement of biaxial moduli of a Si thin-film electrode as a function of its lithium concentration. During lithiation, biaxial compressive stress is induced in…
In Situ Measurements of Stress-Potential Coupling in Lithiated Silicon
Vijay A. Sethuraman, Venkat Srinivasan, Allan F. Bower +1
An analysis of the dependence of electric potential on the state of stress of a lithiated-silicon electrode is presented. Based on the Larché and Cahn chemical potential for a soli…
Real-time Measurement of Stress and Damage Evolution During Initial Lithiation of Crystalline Silicon
Michael J. Chon, Vijay A. Sethuraman, Anthony McCormick +2
Crystalline to amorphous phase transformation during initial lithiation in (100) silicon-wafers is studied in an electrochemical cell with lithium metal as the counter and referenc…