activity
20102016
most citedIs adhesion superficial? Silicon wafers as a model system to study van der Waals interactions

47 citations · 47 across the 4 of their papers we have counts for

collaborators
Showing 2010Show all

1 paper · 1 filter

cond-mat.supr-con2010

The order parameter of high temperature superconductors, as measured by Andreev Saint-James reflection, Raman and neutron scattering

Stefan Hüfner, Frank Müller

By comparing experiments that use Andreev Saint-James reflection, Raman scattering (B2g) and neutron scattering on the (cuprate) high temperature superconductors, evidence is found…