Probing interlayer van der Waals strengths of two-dimensional surfaces and defects, through STM tip-induced elastic deformations

Nirjhar Sarkar, Prabhakar R. Bandaru, Robert C. Dynes

A methodology to test the interlayer bonding strength of two-dimensional (2D) surfaces and associated one (1D)- and two (2D)- dimensional surface defects using scanning tunneling m…