most citedA fully automatized method for the unambiguous wavelength-by-wavelength determination of the thickness and optical property of a very thin film with a transparent range

3 citations · 3 across the 1 of their papers we have counts for

collaborators

1 paper

physics.optics2023★ 3 cited

A fully automatized method for the unambiguous wavelength-by-wavelength determination of the thickness and optical property of a very thin film with a transparent range

Florian Maudet, Charlotte Van Dijck, Muhammad Hamid Raza +1

Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin…