collaborators

1 paper

cond-mat.mtrl-sci2010

Extremely Low Drift in Amorphous Phase Change Nanowire Materials

Mukut Mitra, Yeonwoong Jung, Daniel S. Gianola +1

Time-dependent drift of resistance and threshold voltage in phase change memory (PCM) devices is of concern as it leads to data loss. Electrical drift in amorphous chalcogenides ha…