activity
20102023
most citedCatastrophic thinning of dielectric elastomers

91 citations · 142 across the 6 of their papers we have counts for

collaborators

6 papers

math-ph2023

Hierarchical physically based machine learning in material science: the case study of spider silk

Vincenzo Fazio, Nicola Maria Pugno, Orazio Giustolisi +1

Multiscale phenomena exhibit complex structure-function relationships, and predicting their macroscopic behavior requires deducing differential equations at different scales. The c…

physics.gen-ph20236 cited

A new concept for superior energy dissipation in hierarchical materials and structures

G. Puglisi, N. M. Pugno

We propose a new conceptual approach to reach unattained dissipative properties based on the friction of slender concentric sliding columns. We begin by searching for the optimal t…

cond-mat.soft2023

"Water to the ropes": a predictive model for the supercontraction stress of spider silks

Vincenzo Fazio, Nicola Maria Pugno, Giuseppe Puglisi

When humidified at different moisture conditions, restrained spider silk fibers can exhibit a very high supercontraction phenomenon. The hydration water molecules induce a Hydrogen…

cond-mat.soft201691 cited

Catastrophic thinning of dielectric elastomers

Giuseppe Zurlo, Michel Destrade, Domenico DeTommasi +1

We provide a clear energetic insight into the catastrophic nature of the so-called creasing and pull-in instabilities in soft electro-active elastomers. These phenomena are ubiquit…

cond-mat.soft201443 cited

Multiscale mechanics of macromolecular materials with unfolding domains

Domenico De Tommasi, Giuseppe Puglisi, Giuseppe Saccomandi

We propose a general multiscale approach for the mechanical behavior of three-dimensional networks of macromolecules undergoing strain-induced unfolding. Starting from a (statistic…

cond-mat.mtrl-sci20102 cited

Failure mechanisms in thin electroactive polymer actuators

D. De Tommasi, G. Puglisi, G. Saccomandi +1

We propose a model to analyze the insurgence of pull-in and wrinkling failures in electroactive thin films. We take in consideration both cases of voltage and charge control, and s…