4 papers
Detecting Defective Wafers Via Modular Networks
Yifeng Zhang, Bryan Baker, Shi Chen +4
The growing availability of sensors within semiconductor manufacturing processes makes it feasible to detect defective wafers with data-driven models. Without directly measuring th…
A Kriging Metamodel with Adaptive Sampling for Seismic Evaluation of Podium Buildings
Yuying Huang, Zhiyong Chen, Samuel W. K. Wong
In this paper, nonlinear time-history dynamic analyses of selected earthquake ground motions are conducted on designated wood-frame podium buildings and the resulting inter-story d…
Evolution Process of Wurtzite ZnO Films on Cubic MgO (001) Substrates: a Structural, Optical and Electronic Investigation of the Misfit Structures
Hua Zhou, Hui-Qiong Wang, Yaping Li +8
The interface between hexagonal ZnO films and cubic MgO (001) substrates, fabricated through molecular beam epitaxy, are thoroughly investigated. X-ray diffraction and (scanning) t…
Physical origin of superconductivity in EuFe2As1.4P0.6 and EuFe2As2: pressure-induce valence change of europium
Liling Sun, Jing Guo, Genfu Chen +10
Superconductivity can be realized in Eu-containing pnictides by application of chemical (internal) and physical (external) pressure, the intrinsic physical mechanism of which attra…