most citedLattice deformation at the sub-micron scale: X-ray nanobeam measurements of elastic strain in electron shuttling devices

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cond-mat.mtrl-sci2023★ 15 cited

Lattice deformation at the sub-micron scale: X-ray nanobeam measurements of elastic strain in electron shuttling devices

C. Corley-Wiciak, M. H. Zoellner, I. Zaitsev +11

The lattice strain induced by metallic electrodes can impair the functionality of advanced quantum devices operating with electron or hole spins. Here we investigate the deformatio…